Visit Gamma Scientific in Booth 633 at SID Display Week to see live demonstrations of our new Thin Film Measurement Systems.

Display Week 2013 is being held at the Vancouver Convention Centre in Vancouver, Canada from May 21-23, 2013.

Isolated First Surface Testing of AR Coatings

Our Thin Film Measurement systems provide isolated first surface measurement of anti-reflection coatings on substrates down to 0.5mm thick.

The unique design of our instruments allows manufacturers to perform single sided inspection on the first surface of any glass of polished, transmissive element while excluding the second surface. This application has been optimized for testing anti-reflection coating on display glass for flat panel monitors, tablets and mobile phones.

We are happy to announce that we will be demonstrating our new, Optical Integrating Tube and Spectral Sphere Systems in booth 301 at the Strategies in Light conference in Santa Clara, CA from February 12-14, 2013.

Seven Factors Affecting Spectroradiometer Accuracy

Applications for Optical Position Sensing

An introduction to position sensors and position sensing from Gamma Scientific. 

Retroreflectometer applications and understanding the rules of retroreflective testing. 

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A new calibration technique for improving the accuracy of chromaticity and luminance values obtained from a tristimulus colorimeter has been developed. Matrix manipulations similar to ASTM standard practice E 1455 are applied with a goal of minimizing the errors in x, y, and Y measurement, rather than those of the tristimulus values X, Y, Z. Correction matrices are determined from CRT colors, as well as CRT colors together with other light-source colors.

We have now merged the websites for Gamma Scientific and UDT Instruments (a division of Gamma Scientific).  All of the information and resources previously found on www.udtinstruments.com are now on www.gamma-sci.com. 

This post provides an overview of key concepts in display and monitor calibration, with emphasis on general concepts and concise descriptions. Topics include photometric measurements (luminance, contrast ratio, gamma), color measurements (chromaticity, color temperature, gamut mapping, dominant wavelength and purity, white balance/gray balance) and multidimensional characteristics (uniformity, reflection, BRDF, MTF).